XOS fleX-Beam
Features and Benefits? fleX-Beam’s intensity is up to 10,000 times greater than conventional pinhole collimators? Focal spot as small as 5μm @ Rh Ka (20.162keV)? 50 watt performance exceeds convention
- Model: FLEX-BEAMS
Features and Benefits? fleX-Beam’s intensity is up to 10,000 times greater than conventional pinhole collimators? Focal spot as small as 5μm @ Rh Ka (20.162keV)? 50 watt performance exceeds convention
fleX-Beam is a unique, compact X-ray generator that combines a low-powered X-ray source and a precisely aligned polycapillary optic to deliver a bright X-ray beam for advanced material analysis. It provides the turn-key solution for the end-users and ensures the X-ray optics' optimal performance. The innovative design allows seamless x-ray tube replacement and on-site optic alignment. The products have been widely used in commercial instruments for plating thickness measurement, thin-film characterizations, molecular structure analysis, and many other applications.
fleX-Beam is available in several standard focused or collimated beam configurations and can also be customized for specific applications.
? fleX-Beam’s intensity is up to 10,000 times greater than conventional pinhole collimators
? Focal spot as small as 5μm @ Rh Ka (20.162keV)
? 50 watt performance exceeds conventional kilowatt-powered X-ray tubes
? Integrated safety shutter & 8-position filter wheel
fleX-Beam? can be used in different applications where a compact X-ray source with high photon flux is required. Various configurations are available to be used in μ-XRF, diffraction, in-line process monitoring or in-situ analysis, and medical imaging applications. XOS provides custom fleX-Beam optics based on customer requirements.
? Innovative design allows for the ability to interchange different optics, as well as service the X-ray source in the field
? Small Feature Analysis
? Film & Plating Thickness
? High-Resolution Elemental Mapping
? Gun residue study in forensics
? Pigment study in art preservation
? Composition and artifact analysis in archaeology
? Residual Stress Analysis
? Laue Diffraction
? Powder Diffraction