HD-1射線光譜儀
產(chǎn)品介紹：采用柱狀晶體和CCD線陣探測(cè)器， 研制了HD-1 x射線聚焦晶體von Hamos光譜儀。特殊的聚焦幾何形狀用于記錄非常低強(qiáng)度的x射線輻射。主要特點(diǎn)◆ 聚焦集合提供極高的探測(cè)效率◆ 可提供絕對(duì)強(qiáng)度校準(zhǔn)◆ 緊湊的尺寸◆ 無(wú)須更換晶體◆ 最佳探測(cè)范圍：0.6-1.4nm
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產(chǎn)品介紹
采用柱狀晶體和CCD線陣探測(cè)器， 研制了HD-1 x射線聚焦晶體von Hamos光譜儀。特殊的聚焦幾何形狀用于記錄非常低強(qiáng)度的x射線輻射。
主要特點(diǎn)：
◆ 聚焦集合提供極高的探測(cè)效率
◆ 可提供絕對(duì)強(qiáng)度校準(zhǔn)
◆ 緊湊的尺寸
◆ 無(wú)須更換晶體
◆ 最佳探測(cè)范圍：0.6-1.4nm
規(guī)格參數(shù)
資料/文獻(xiàn)
HD-1 X射線光譜儀 datasheet 2022.4.24pdf.pdf
發(fā)表文章：
1. A.P. Shevelko, D.E. Bliss, E.D. Kazakov, M.G. Mazarakis, J.S. McGarn, L.V. Knight, K.W. Struve, I.Yu. Tolstikhina, T.J. Weeks. “EUV spectroscopy of plasmas created in the final anode-cathode gap of the Z-Machine high-current pulsed generator (SNL).” Plasma Physics Report 34 (11), 944-954 (2008).
2. M.S. Bibishkin, E.D. Kazakov, V.I. Luchin, N.N. Salashchenko, V.V. Chernov, N.I. Chkhalo, A.P. Shevelko. “New focusing multilayer strustures for x-ray plasma spectroscopy.” Quantum Electronics 38, 169 (2008).
3. A.Ya. Lopatin, V.I. Luchin, N.N. Salashchenko, N.I. Chkhalo, A.P. Shevelko, O.F. Yakushev. “New focusing multilayer structures for x-ray and VUV plasma spectroscopy.” Technical Physics 55 (7), 1018-1023 (2010).
4. Yu.E. Borozdin, E.D. Kazakov, V.I. Luchin, N.N. Salashchenko, I.Yu. Tolstikhina, V.V. Chernov, N.I. Chkhalo, A.P. Shevelko, O.F. Yakushev. “X-ray and Vacuum-Ultraviolet Plasma Spectroscopy with the Use of New Focusing Multilayer Structures.” JETP Lett. 87, 27-29 (2008).
5. M.B. Agranat, N.E. Andreev, S.I. Ashitkov, A.V. Ovchinnikov, D.S. Sitnikov, V.E. Fortov, A.P. Shevelko. “Generation of characteristic X rays by a terawatt femtosecond chromium-forsterite laser.” JETP Lett. 83 (2), 80-83 (2006).
6. Weeks, M. Harrison, M. Johnson, A. P. Shevelko, J. Ellsworth, S. Bergeson, M. Asplund, L. V. Knight. “Absolute soft x-ray calibration of laser produced plasmas using a focusing crystal von Hamos spectrometer.” SPIE 5918, OR 1-10 (2005).
7. M.B. Agranat, N.E. Andreev, S.I. Ashitkov, E. Boyle, V.E. Fortov, L.V. Knight, A.V.Ovchinnikov, A.P. Shevelko, D.S. “Generation of hard x-rays by a forsterite terawatt laser.” SPIE 5918, 0O 1-10 (2005).
8. А.P. Shevelko, L.V. Knight, J. Phillips, R.S. Turley, C. Turner, O.F. Yakushev. “X-ray and EUV spectral instruments for plasma source characterization.” SPIE5196, 282-288 (2003).
9. P. Shevelko, Yu.S. Kasyanov, O.F. Yakushev, L.V. Knight. “Compact focusing von Hamos spectrometer for quantitative x-ray spectroscopy.” Rev. Sci, Instrum.73 (10), 3458-3463 (2002).
10. Shevelko, A. Antonov, I. Grigorieva, Yu. Kasyanov, O.Yakushev, L. Knight, Q. Wang. “X-ray focusing crystal von Hamos spectrometer with a CCD linear array as a detector.” Adv. X–ray analysis 45, 433-440 (2001).
11. P. Shevelko, L.V. Knight, Q. Wang, O.F. Yakushev. “Absolute x-ray calibration of laser-produced plasmas using a CCD linear array and a focusing crystal spectrometer.” SPIE 4504, 215-226 (2001).
12. C. Turner, L.V. Knight, A. Reyes-Mena, P.W. Moody, H.K. Pew, J.D. Phillips, A.P. Shevelko, S. Voronov, O.F. Yakushev. “Focusing crystal von Hamos spectrometers for XRF applications.” Adv. X-ray analysis 44, 329-335 (2000).
13. P. Shevelko, A.A. Antonov, I.G. Grigorieva, Yu.S. Kasyanov, L.V. Knight, A. Reyes-Mena, C. Turner, Q. Wang, O.F. Yakushev. “A Focusing Crystal von Hamos Spectrometer for X-ray Spectroscopy and X-ray Fluorescence Applications.” SPIE 4144, 148-154 (2000).
HD-1 X射線光譜儀 datasheet 2022.4.24pdf.pdf
發(fā)表文章：
1. A.P. Shevelko, D.E. Bliss, E.D. Kazakov, M.G. Mazarakis, J.S. McGarn, L.V. Knight, K.W. Struve, I.Yu. Tolstikhina, T.J. Weeks. “EUV spectroscopy of plasmas created in the final anode-cathode gap of the Z-Machine high-current pulsed generator (SNL).” Plasma Physics Report 34 (11), 944-954 (2008).
2. M.S. Bibishkin, E.D. Kazakov, V.I. Luchin, N.N. Salashchenko, V.V. Chernov, N.I. Chkhalo, A.P. Shevelko. “New focusing multilayer strustures for x-ray plasma spectroscopy.” Quantum Electronics 38, 169 (2008).
3. A.Ya. Lopatin, V.I. Luchin, N.N. Salashchenko, N.I. Chkhalo, A.P. Shevelko, O.F. Yakushev. “New focusing multilayer structures for x-ray and VUV plasma spectroscopy.” Technical Physics 55 (7), 1018-1023 (2010).
4. Yu.E. Borozdin, E.D. Kazakov, V.I. Luchin, N.N. Salashchenko, I.Yu. Tolstikhina, V.V. Chernov, N.I. Chkhalo, A.P. Shevelko, O.F. Yakushev. “X-ray and Vacuum-Ultraviolet Plasma Spectroscopy with the Use of New Focusing Multilayer Structures.” JETP Lett. 87, 27-29 (2008).
5. M.B. Agranat, N.E. Andreev, S.I. Ashitkov, A.V. Ovchinnikov, D.S. Sitnikov, V.E. Fortov, A.P. Shevelko. “Generation of characteristic X rays by a terawatt femtosecond chromium-forsterite laser.” JETP Lett. 83 (2), 80-83 (2006).
6. Weeks, M. Harrison, M. Johnson, A. P. Shevelko, J. Ellsworth, S. Bergeson, M. Asplund, L. V. Knight. “Absolute soft x-ray calibration of laser produced plasmas using a focusing crystal von Hamos spectrometer.” SPIE 5918, OR 1-10 (2005).
7. M.B. Agranat, N.E. Andreev, S.I. Ashitkov, E. Boyle, V.E. Fortov, L.V. Knight, A.V.Ovchinnikov, A.P. Shevelko, D.S. “Generation of hard x-rays by a forsterite terawatt laser.” SPIE 5918, 0O 1-10 (2005).
8. А.P. Shevelko, L.V. Knight, J. Phillips, R.S. Turley, C. Turner, O.F. Yakushev. “X-ray and EUV spectral instruments for plasma source characterization.” SPIE5196, 282-288 (2003).
9. P. Shevelko, Yu.S. Kasyanov, O.F. Yakushev, L.V. Knight. “Compact focusing von Hamos spectrometer for quantitative x-ray spectroscopy.” Rev. Sci, Instrum.73 (10), 3458-3463 (2002).
10. Shevelko, A. Antonov, I. Grigorieva, Yu. Kasyanov, O.Yakushev, L. Knight, Q. Wang. “X-ray focusing crystal von Hamos spectrometer with a CCD linear array as a detector.” Adv. X–ray analysis 45, 433-440 (2001).
11. P. Shevelko, L.V. Knight, Q. Wang, O.F. Yakushev. “Absolute x-ray calibration of laser-produced plasmas using a CCD linear array and a focusing crystal spectrometer.” SPIE 4504, 215-226 (2001).
12. C. Turner, L.V. Knight, A. Reyes-Mena, P.W. Moody, H.K. Pew, J.D. Phillips, A.P. Shevelko, S. Voronov, O.F. Yakushev. “Focusing crystal von Hamos spectrometers for XRF applications.” Adv. X-ray analysis 44, 329-335 (2000).
13. P. Shevelko, A.A. Antonov, I.G. Grigorieva, Yu.S. Kasyanov, L.V. Knight, A. Reyes-Mena, C. Turner, Q. Wang, O.F. Yakushev. “A Focusing Crystal von Hamos Spectrometer for X-ray Spectroscopy and X-ray Fluorescence Applications.” SPIE 4144, 148-154 (2000).