ePix® Timepix3 直接探測電子相機
特點優(yōu)勢:• Single electron sensitivity• Large solid angle in a very small package• High spatial resolution• Ultra-fast read out• Energy thresholding
- 產(chǎn)地: 捷克
- 型號: ePix?
- 品牌: Advascope
特點優(yōu)勢:• Single electron sensitivity• Large solid angle in a very small package• High spatial resolution• Ultra-fast read out• Energy thresholding
ePix?是一款基于Timepix3芯片的混合像素探測器,用于電子顯微鏡,可實現(xiàn)實時直接電子探測。
ePix?使用數(shù)據(jù)驅(qū)動的讀出模式,每個電子都被分配一個包含精確位置和能量信息的時間戳。
與間接電子探測相比,ePix?的動態(tài)范圍幾乎不受限制,在低能段的靈敏度提高了幾個數(shù)量級。
ePix?將高性能讀出架構(gòu)與創(chuàng)新、堅固的探測器設(shè)計相結(jié)合,為高通量,高分辨率和高靈敏度電子顯微鏡應用提供了非常合適的探測器解決方案。
? 單電子靈敏度
? 小面積,大立體角
? 高空間分辨率
? 超高速讀出
? 能量閾值
CMOS technology | 130 nm |
Pixel size | 55 × 55 μm |
Pixel matrix | 256 × 256 |
Sensitive area | 14 × 14 mm |
Sensor material / types | Si / 100, 300, 500 μm |
TOA resolution | 1.56 ns |
Hit rate in Data-driven mode | 64 Mhit/s |
Energy range | 2.5—300 keV |
Readout | USB-C |
Typical power consumption | 3.5 W |
Readout modes | Data-driven zero-suppressed Frame based zero-suppressed |
Pixel mode of operation | simultaneous Time-Over-Threshold and Time-Of-Arrival or integral Time-Over-Threshold and event count |
Extended front-end | 69 mm × 28 mm × 16 mm |
dimensions | |
Read out dimensions | 104 mm × 67 mm × 30 mm |
Detector mounting | Customizable |
External synchronization | LVDS signals? Trigger In, Trigger Out, Clock In, Clock Out, Ready In, Ready Out |
Front-end to Readout distance | up to 45 cm |
Temperature stabilized | Peltier cooled |
? (4D) STEM in SEM/TEM
? μED (micro electron diffraction)
? EBSD
? EELS
? Micro/nano CT
? Ptychography
CMOS technology | 130 nm |
Pixel size | 55 × 55 μm |
Pixel matrix | 256 × 256 |
Sensitive area | 14 × 14 mm |
Sensor material / types | Si / 100, 300, 500 μm |
TOA resolution | 1.56 ns |
Hit rate in Data-driven mode | 64 Mhit/s |
Energy range | 2.5—300 keV |
Readout | USB-C |
Typical power consumption | 3.5 W |
Readout modes | Data-driven zero-suppressed Frame based zero-suppressed |
Pixel mode of operation | simultaneous Time-Over-Threshold and Time-Of-Arrival or integral Time-Over-Threshold and event count |
Extended front-end | 69 mm × 28 mm × 16 mm |
dimensions | |
Read out dimensions | 104 mm × 67 mm × 30 mm |
Detector mounting | Customizable |
External synchronization | LVDS signals? Trigger In, Trigger Out, Clock In, Clock Out, Ready In, Ready Out |
Front-end to Readout distance | up to 45 cm |
Temperature stabilized | Peltier cooled |
? (4D) STEM in SEM/TEM
? μED (micro electron diffraction)
? EBSD
? EELS
? Micro/nano CT
? Ptychography
The diffraction pattern measured for
Si sample aligned to [100] zone axis.
ePix EFE Product Sheet, standard-眾星聯(lián)恒.pdf
ePIX Timepix3 datasheet v1 from 1_24 _眾星聯(lián)恒.pdf
A4_Advascope_twopager_digital-眾星聯(lián)恒.pdf